TRANSMISSION ELECTRON MICROSCOPY
The transmission electron microscope (TEM) is the most powerful electron microscope at MVA Scientific Consultants.
In the TEM, a very high-energy electron beam is placed on a sample that is thin enough to be partially electron transparent, and the electron “shadow” of the sample is viewed and digitally recorded.
Sample preparation for TEM analysis is critical.
Samples must be extremely thin or made extremely thin to allow for the electron beam to completely penetrate a sample. Depending on the composition of the sample, we utilize two thinning techniques for preparing TEM samples: ion milling and ultramicrotomy.
Using energy dispersive x-ray spectrometry (EDS), brightfield and darkfield imaging, and electron diffraction, our TEM capabilities can be used to characterize and identify a wide range of materials.